U2723A

Keysight U2723A USB Modular Source Measure Unit

The Keysight U2723A offers extra highlights, including installed test contents to simplify automated testing and speedier rise time to help enhance throughput amid mass testing of semiconductor component. The optional Keysight U2941A parametric test apparatus is intended to supplement the utilization of U2723A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.

When this Source Measure Unit is used with the Keysight Parametric Measurement Manager Pro programming, the result is an essential and complete parametric measuring test arrangement that examines the execution of components, such as diodes and transistors without the requirement of past programming experience. Parametric testing is utilized over an assortment of businesses – from a teaching device in the instruction area to assembling and investigating in the semiconductor business. Presently, the user can quantify and examine rapidly and proficiently in every one of these zones with the one-stop Parametric Measurement Solution.

The positive operating quadrant of the U2723A in the source voltage mode is a contribution of security current line representing the input protection of current configurations. The voltage source line represents the source voltage settings. These lines are the limits that the U2723A will operate inside. The U2723A has both nearby and remote sensing abilities. When remote sensing is linked, the sense lines can be specifically associated with the DUT. When the U2723A is in source voltage mode, remote sensing empowers the voltage to be detected at the load which results in better regulation.